#include <kmt_test.h>
KMT_TESTFUNC Test_Example;
+KMT_TESTFUNC Test_ExCallback;
KMT_TESTFUNC Test_ExDoubleList;
KMT_TESTFUNC Test_ExFastMutex;
KMT_TESTFUNC Test_ExHardError;
KMT_TESTFUNC Test_ExTimer;
KMT_TESTFUNC Test_FsRtlExpression;
KMT_TESTFUNC Test_IoDeviceInterface;
+KMT_TESTFUNC Test_IoEvent;
KMT_TESTFUNC Test_IoInterrupt;
KMT_TESTFUNC Test_IoIrp;
KMT_TESTFUNC Test_IoMdl;
KMT_TESTFUNC Test_KeEvent;
KMT_TESTFUNC Test_KeGuardedMutex;
KMT_TESTFUNC Test_KeIrql;
+KMT_TESTFUNC Test_KeMutex;
KMT_TESTFUNC Test_KeProcessor;
+KMT_TESTFUNC Test_KeTimer;
KMT_TESTFUNC Test_KernelType;
+KMT_TESTFUNC Test_MmSection;
KMT_TESTFUNC Test_ObReference;
KMT_TESTFUNC Test_ObType;
KMT_TESTFUNC Test_ObTypeClean;
KMT_TESTFUNC Test_ObTypeNoClean;
+KMT_TESTFUNC Test_ObTypes;
+KMT_TESTFUNC Test_PsNotify;
KMT_TESTFUNC Test_RtlAvlTree;
+KMT_TESTFUNC Test_RtlException;
KMT_TESTFUNC Test_RtlMemory;
KMT_TESTFUNC Test_RtlSplayTree;
const KMT_TEST TestList[] =
{
+ { "ExCallback", Test_ExCallback },
{ "ExDoubleList", Test_ExDoubleList },
{ "ExFastMutex", Test_ExFastMutex },
{ "ExHardError", Test_ExHardError },
{ "Example", Test_Example },
{ "FsRtlExpression", Test_FsRtlExpression },
{ "IoDeviceInterface", Test_IoDeviceInterface },
+ { "IoEvent", Test_IoEvent },
{ "IoInterrupt", Test_IoInterrupt },
{ "IoIrp", Test_IoIrp },
{ "IoMdl", Test_IoMdl },
{ "KeEvent", Test_KeEvent },
{ "KeGuardedMutex", Test_KeGuardedMutex },
{ "KeIrql", Test_KeIrql },
+ { "KeMutex", Test_KeMutex },
{ "-KeProcessor", Test_KeProcessor },
+ { "KeTimer", Test_KeTimer },
{ "-KernelType", Test_KernelType },
+ { "MmSection", Test_MmSection },
{ "ObReference", Test_ObReference },
{ "ObType", Test_ObType },
{ "-ObTypeClean", Test_ObTypeClean },
{ "-ObTypeNoClean", Test_ObTypeNoClean },
+ { "ObTypes", Test_ObTypes },
+ { "PsNotify", Test_PsNotify },
{ "RtlAvlTreeKM", Test_RtlAvlTree },
+ { "RtlExceptionKM", Test_RtlException },
{ "RtlMemoryKM", Test_RtlMemory },
{ "RtlSplayTreeKM", Test_RtlSplayTree },
{ NULL, NULL }